This glossary lists all the abbreviations used in the User Guide.
Analog to Digital Converter. A device that converts an analog signal into digital data.
AMBA Design Kit. The ADK comprises the building blocks required to create an example system based on the low-power, generic design methodology of the Advanced Microcontroller Bus Architecture (AMBA).
Advanced High-performance Bus. The ARM open standard for on-chip buses.
Advanced Microcontroller Bus Architecture.
Advanced Peripheral Bus. The ARM open standard for peripheral buses. This design is optimized for low power and minimal interface complexity
Bill Of Materials. A list of all the parts used on the printed circuit board and any specific build instructions for board variants.
Digital to Analog Converter. A device that converts digital data into analog level signals.
Debug Communications Controller.
Embedded Trace Buffer.
Embedded Trace Macrocell.
Field Programmable Gate Array.
General Test Chip. A packaging and signal assignment specification for test chips.
In Circuit Emulator. A interface device for configuring and debugging processor cores.
Integrator Compact Platform.
Integrator/IM-LT1 Interface Module.
Integrator/IM-LT3 Interface Module.
Joint Test Action Group. The committee which defined the IEEE test access port and boundary-scan standard.
Multi-ICE is a system for debugging embedded processor cores using a JTAG interface.
Printed Circuit Board.
Memory specification for plug in memory modules.
Programmable Logic Device.
Phase-Locked Loop, a type of programmable oscillator.
Power On Reset.
Random Access Memory.
RealView ICE. A system for debugging embedded processor cores using a JTAG interface.
Static Random Access Memory.
Tightly Coupled Memory. Memory present inside the test chip that typically runs at or near the processor speed.